Nanoelectronic Imaging
NEI’s Scanning TEM Electron Beam-Induced Current (STEM EBIC) imaging system has produced several best-in-the-world results in quantitatively mapping temperature, conductivity, potential, electric field, and work function. Few alternatives can map any of these properties at high resolution, and none can map them all. Standard TEM imaging only identifies where the atoms are in an electronic device – NEI’s technology shows what they are doing. Visit our YouTube channel for more information about what our system can do:
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