Signal Integrity Journal

Signal Integrity Journal (SIJ), a sister publication to Microwave Journal, covers signal integrity, power integrity and EMC/EMI related topics with industry news, technical articles, white papers, products, Buyer’s Guide, webinars, videos and more. SIJ is the only peer reviewed, industry journal covering these markets. It began as a website, and added the publication of a magazine in 2017. A distinguished Editorial Advisory Board (EAB), assists the editorial staff in the article review process and generation of quality content. Editor: Patrick Hindle, Media Director at Microwave Journal & Signal Integrity Journal Technical Editor: Eric Bogatin, Professor, University of Colorado, Boulder in the ECEE dept and Teledyne LeCroy Fellow Editorial Advisory Board (EAB): Rula Bakleh, AMD Benjamin Dannan, Signal Edge Solutions Jay Diepenbrock, SI/RF Consultant Vladimir Dmitriev-Zdorov, Mentor Graphics Jason Ellison, TE Connectivity HeeSoo Lee, Keysight Barry Katz, MathWorks Cathy Liu, Broadcom Alfred Neves, Wildriver Technology Istvan Novak, Samtec Prashant Pappu, Amazon Steve Sandler, Picotest Yuriy Shlepnev, Simberian Inc. Bert Simonovich, LAMSIM Enterprises Stephen Slater, Keysight Mark Steffka, Retired Faculty of University of Detroit Mercy Stephen Slater, Keysight Technologies Larry Smith, Micron Michael Violette, Washington Laboratories Learn more here: