Abby Liu

Background

About Abby Liu

As a semiconductor materials scientist with a focus on process development, defect characterization, and advanced microscopy, I’m passionate about enabling next-generation electronics through data-driven engineering solutions. Currently completing my Ph.D. in Materials Science and Engineering at the University of Michigan, I bring hands-on experience in CVD and MBE process optimization, atomic-scale TEM/STEM imaging, and recipe development for GaN-based and topological insulator thin films. During my internship at Intel, I conducted a systematic CVD study for 18A/14A nodes, applying DOE and SPC analysis to improve film consistency and yield. I collaborated with tool vendors and engineers to identify root causes of variation, gaining valuable experience in cross-functional troubleshooting and process validation within a high-volume manufacturing environment. My background spans both academic and industrial settings, with demonstrated success in in situ process design, data modeling (JMP, Python), and technical communication through publications and conferences. As I transition into a full-time role, I look forward to driving innovation in semiconductor process and tool development by leveraging my background in materials engineering, advanced microscopy, and data-driven decision-making.