Alan T.
Rf Characterization Engineer at Xilinx
Based in San Jose, United States
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Seniority
Staff
Department
Engineering
Location
San Jose
Industry
Semiconductor Manufacturing
Company size
1.7K
Contact information
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a•••••••@amd.com
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Background
About Alan T.
Technical lead on programs for RF, analog, mixed-signal and digital ATE solutions for both wafer and module testing • Experienced in one-on-one interface with customers, design and supervision of board layout for tester interface, test program generation, debug analysis, test limit determination, data analysis and correlation and final implementation for manufacturing solution for both local and oversea test houses • Experience in multitude of ATE platforms such as Advantest 6671/6672, Schlumberger ITS Credence Duo/Quartet and Teradyne’s Catalyst, A5, uFlex and iFlex • Extensive experience in RF, mixed-signal and digital testing • Extensive experience in using Cadence Concept and Allegro software for PC board design, layout and fabrication • Extensive knowledge of TSSI software for translating vectors to tester patterns • Experienced programmer of C, C++, C#, Visual Basic, TCL and PERL • Complete familiarity with test equipment such as network analyzer, spectrum analyzer, DSO, power meter, AWG, logic analyzer, VSA and DMMs • Experienced in wafer testing with cantilever, cobra and Cascade membrane probes
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