Antonio Nanni

Background

About Antonio Nanni

Microwave Production and Test Engineer, focusing his attention on OWT Measurements, GaAs and GaN FET modelling, automatic and semiautomatic RF test-benches. Principal Skills: Linear and nonlinear Modelling of scalable FET (GaAs/GaN tecnology) and passive components in AWR and ADS environments, PDKs implementation in AWR. Layout optimization of GaN and GaAs based transistor oriented to increase RF performance as Gain, Pout, PAE through data analysis and simulations. Development of RF test-benches to characterize FET and IC: Pulsed I/V Systems (Current Collapse), Hot/Cold and Cold Source Pull System (Noise Figure measurements), CW and Pulsed Source/Load Pull System (Output power and PAE), RF Stress Test (Reliability). Implementation of in-house Automatic Test systems to characterize MMICs, Labview environment. Development and Implementation of on-wafer calibration routine: TRL with Zc correction, SOLT and SOLR algorithms, Matlab environment. A deep understanding of basic and higher level DC & RF measurement equipments and techniques (Maury,Focus,Auriga,Diva,Agilent,Anritsu.). Test plan definition and execution