Ashley Haire
Staff Engineer Module Engineer at Intel
Based in Gilbert, United States
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Seniority
Other
Department
Other
Location
Gilbert
Industry
Semiconductor Manufacturing
Company size
110K
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Background
About Ashley Haire
Graduate Research Assistant, Aug. 2008 - Dec. 2012 Department of Chemical and Biomedical Engineering • Performed independent research and trained undergraduate/graduate students in peptide synthesis and high performance liquid chromatography. • Coordinated multidisciplinary team research projects that led to publication. • Studied solid state nuclear magnetic resonance (ssNMR) spectroscopy, biomaterials for regenerative medicine, and protein self-assembly. • Characterized molecular structure of small designer self-assembling proteins with ssNMR in order to add to our understanding of amino acid sequence design and structure. • Developed skills in peptide synthesis, high performance liquid chromatography for purification, ultraviolet visible spectroscopy, and 500 MHz spectrometer for ssNMR. Engineering Intern, May 2007 – March 2008 Lin and Associates Inc. Phoenix, AZ • In charge of converting Honeywell Total Distributed Control, TDC, Native Window graphics to Honeywell Global User Station, GUS, graphics. • Responsible for converting Honeywell TDC Native Window graphics to Experion Process Knowledge System, PKS, graphics. • Helped document Boolean logic loop narratives so that others could build graphics off of the logic documentation. Process Engineering Intern FAB12, Summer 2006 Intel Corporation Chandler, AZ • Process engineer in the Lithograpy area, 248 BE/slam process. Responsible for experiment setup, data collection and equipment testing. • Daily tasks included running qualification and process monitor tests for new tools coming up to production. Intel Process Tools used: FDT to count surface film defects, ORB to picture defects, DOR to classify defects, FTM to measure film thickness and STD, MIK to read E0 wafers, Lithius TLA251-258 to run project on, and Nikon STA251-258. Intel Analytical Software/Programs used: Klarity to record defect findings for statistical analysis, and SPC++ statistical charts to understand film thickness data trends.
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