Astor Yoo

Background

About Astor Yoo

Experienced Reliability Engineer and Data Scientist. With over 10 years of expertise in reliability engineering and data science across top-tier companies such as LG Innotek(Camera Module), and Samsung SDI(Battery), I specialize in leading product reliability strategies, performing advanced failure analysis, and implementing cutting-edge AI-driven models for predictive analytics. Key Highlights: • Led New Product Introduction (NPI) and Ongoing Reliability Testing (ORT) for Apple camera modules, ensuring top-notch reliability from design to mass production. • Spearheaded the development of CNN-based image classifiers and Gaussian Process-based prediction models to enhance data-driven reliability and defect forecasting. • Conducted comprehensive failure analysis using advanced tools (SEM, FT-IR, TOF-SIMS, Nano CT) and collaborated with cross-functional teams to resolve critical product issues. • Conducted research on machine learning techniques at Samsung, optimizing reliability testing and prediction models. • Developed and optimized a CNN-based image classifier to improve defect identification and analysis, while performing data correlation and black-box interpretation to understand complex system behaviors. • Designed a Gaussian Process-based market failure prediction model at Samsung, enabling more accurate forecasts and proactive reliability management. • Optimized reliability processes at Samsung, focusing on actuator performance and failure mitigation, while supporting global clients like Oppo, Huawei, and Xiaomi. Core Skills: • Machine Learning & AI for Predictive Modeling • Data Correlation & Black Box Interpretation • Advanced Failure Analysis (SEM, FT-IR, Nano CT) • Product Reliability Engineering (NPI, ORT) • CNN-based Image Classifier Development • Cross-Functional Team Leadership Certification: • ISO 9001:2015 Auditor • CRE • 6Sigma Black Belt