Bruce Kochheiser
Device Techncian at Nxp Acquires Freescale Semiconductor
Based in Kyle, United States
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Seniority
Staff
Department
Other
Location
Kyle
Industry
Semiconductor Manufacturing
Company size
6K
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b•••••••@nxp.com
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Background
About Bruce Kochheiser
Working with Hamamatsu OBIRCh (Optical beam induced resistance change) to identify both high resistive locations as well as shorts. Hitachi SEM’S 4800, 8100 close inspection of failures and measured thicknesses of processed layers. Worked with FIBS 820,830,835, Strata, and Helios. Worked directly with Eng. to develop and find single Bit failures on Hip7, Hip8, SOI using Knights/Camelot/Avalon CAD navigation software to overlay the device schematic to the FIB (Focused Ion Beam). And precisely cut the bit cell to find root causes, as to which layer the single bit failure had occurred
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