Cameron Kopas

Background

About Cameron Kopas

PhD candidate studying cryogenic superconductor and semiconductor device physics, focusing on novel low-loss dielectrics, defects and loss in superconducting microwave resonators."super-user"/"tool owner" in charge of managing >9 Ultra High Vacuum systems for material/device deposition and analysis, including- Molecular Beam Epitaxy (MBE) and sputter chambers with in-situ RHEED - Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)- Pulsed Laser Ablation / Laser Deposition (PLD) Current research includes identifying origins of loss for superconducting microwave resonator devices by studying defects at superconductor / semiconductor interfaces using TOF-SIMS, DLTS, I-V/C-V Well versed in chemical, structural, and electrical characterization techniques; Rutherford Backscattering Spectroscopy (RBS), Time of Flight Secondary Ion Mass spectrometry (TOF-SIMS), X-Ray Diffraction (XRD), Transmission Electron Microscopy (TEM), and cryogenic measurements of electrical properties. I have worked with low-temperature and high-temperature superconductors, novel semiconductors, high-K dielectrics, Schottky diodes, coplanar resonators, transition edge bolometers, and studied the effects of radiation damage on superconducting devices, simulating damage using a 1.7MeV Tandetron accelerator, and light element and defect characterization using Ion Beam techniques. Specialties: Science, technology, Science outreach, leading group efforts, overcoming obstacles, semiconductor physics, materials characterization, superconductors, utilizing specific techniques; RBS, XRD, TEM analysis, TOF-SIMS, and high vacuum growth techniques such as MBE and sputtering.