Indranil de
VP Gm, Design for Inspection (Dfi) at Pdf Solutions
Based in Newark, United States
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Seniority
Other
Department
Other
Location
Newark
Industry
Software Development
Company size
939
Contact information
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i•••••••@pdf.com
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Background
About Indranil de
Technologist with breadth in semi, solar, technology;>20 patents issued or pending • Built & managed high-performance teams >50 people for semi capital equipment design. • Track record for conceiving disruptive technology in wafer processing and inspection. • ALD/PVD/Ultra-high-vacuum tool development and thin film material development • Semiconductor front end processing. Device and process Simulation (TCAD) • eBeam Wafer inspection and voltage contrast physics • SW and Algos for high-performance computing, image processing, FEM simulation
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