Jay Dote

Background

About Jay Dote

Over 25 years of experience in semiconductor test engineering w/ strong background in probe and final test environment in developing test solutions for semiconductor IC. Experienced in product and test engineering which includes but are not limited to line sustaining, yield analysis and improvement, test optimization, new product development and transfer of test programs from test development to production. Responsible for the new product test development. This includes design of test board schematic diagram, development of test programs, samples testing, characterization of new IC product, qual testing, yield analysis testing, engineering evaluation which includes correlation and repeatability testing, ESD test, EOS check, device pin checking, and production testing (inventory build test) using different ATEs and handlers. Technically sound in analog, digital and mixed signal testing with a supervisory skills and leadership skills to provide technical directions. Knowledgeable on automatic test equipment such as Credence 3K, 1K, Teradyne Flex and Micro-Flex. Had working knowledge on Wafer Prober and Handlers like MCT, Multi-test, SRM and Rasco. Familiar in using telecom and laboratory test equipment such as Spectrum Analyzer, Signal Generator, Scalar Network Analyzer, CW Swept Oscillator, Oscilloscope, Noise Figure Meter, Power Meter, Multimeter, Signal & Function Generator, Multimeter etc. Worked on different devices like accelerometer, gyroscopes, low dropout regulators, buck and boost converters, Switchers, FET drivers and MOSFETS. Has been exposed to different working environment and willingness to travel if required.