Jongseo Lee

Background

About Jongseo Lee

Summary Over the past 20+ years, participated in HW/SW development projects for various semiconductor test systems, developed unit test/verification/characterization programs, contributed to verifying and debugging the functions of SW/HW, analyzed characteristics, and provided feedback on problems. Through this, the company was able to deliver the developed HW/SW to customers in a short period of time. During the project, not only test systems but also external measurement equipment such as oscilloscope, spectrum analyzer, signal generator, DMM, power meter, and VNA were used. Development projects include HW like digital, SERDES, VI, Analog, RF, TMU, memory, FPD, and handler-prober interfaces that can test almost all currently available semiconductors. And basic programming languages like C++/C/Java and script languages like Python/Perl/Java based on Linux/Unix/Windows OS were used. Job Objective SW/HW test engineer/Software developer is seeking a verification, test, application, system level test, and/or QA engineer position at HW/SW engineering company. Has a strong foundation in programming languages such as C++ and Python and will do my best to provide techniques of revolutionary test/verification/debugging/quality assurance through the past 20+ years’ experiences. Skills Job titles System level test engineer, Software and software test engineer, Application engineer, Test engineer, QA Engineer, hardware test and verification engineer. Environments Windows, UNIX, Linux 4.3 ~ 9.1 Programming C, C++, C#, Java, Python, Perl, Fortran, Coble, Assembler, Visual Basic, Visual studio, VISA, MS Office, Ms.net SW project, MATLAB, Clearcase version control. Git. Measuring instruments Oscilloscope, SDA (Serial data analyzer), Bert (Bit Error Rate tester), AP2700(Audio Precision Analog analyzer), Logic analyzer, Spectrum analyzer, VNA, NPR6A Power Meter, SMA100 RF and MicroWave Signal Generator, KeySight AWG, and so on. Test Systems Xincom5588 Fairchild, Schlumberger series, Minato Memory Testers M Series, Advantest Memory Tester T-Series, Teradyne Memory Tester J937, Credence Diamond Series, LTX PAx/X-Series testers, NPtest CPU/Logic tester, Cohu DMDx/DMD/PAx/DxV digital, analog, RF testers.