Lou Piloco

Background

About Lou Piloco

Lou is Manager of the Systems Engineering Group where he and his team are developing state of the art algorithms designed to detect defects for a variety of industrial inspection applications. These applications include 1) semi-conductor wafer macro-inspection to detect and quantify process related defects (i.e. particles, uneven coating, exposure pattern defects, etc.), 2) Bond-wire inspection using x-ray images to locate and measure bond-wires internal to the an integrated circuit and detect broken, missing or severely distorted wires. 3) Ball Grid Array (BGA) solder ball void detection analysis to detect and quantify void pockets in the electrical connection. For nearly 37 years Lou has been involved the development of both hardware and software systems for variety of different high-technology products ranging from automated microscopes to motion control systems to algorithms for industrial inspection. All of these products addressed very difficult “image processing” challenges in the bio-medical and industrial-inspection fields. Lou holds nearly two dozen patents related to his work in bio-medical imaging and industrial inspection.