Michael Campin

Application Engineer at Zeiss Microscopy

Based in Pleasanton, United States

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Seniority

Staff

Department

Information Technology

Location

Pleasanton

Industry

Nanotechnology Research

Company size

2K

Contact information

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Email

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m•••••••@zeiss.com

Phone

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+1 ••• •••• ••••

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Background

About Michael Campin

I am a high-tech, customer focused professional, leveraging Physical Failure Analysis (PFA) and materials characterization to enhance nanotechnology and drive cost savings. I collaborate effectively with multi-cultural and global teams to identify root cause failure modes and troubleshoot solutions that improve product performance, efficiency and capabilities. I have in-depth expertise in deprocessing and analysis of site-specific defects on state-of-the-art semiconductor chips using conventional, Dual-Beam Focused Ion Beam (DB-FIB) and Transmission Electron Microscopy (TEM) techniques. I also have demonstrated strength for acquiring and evaluating various types of data used to characterize products and their applications.Expertise in: Electron Microscopy Imaging and Data Analysis• High-resolution TEM (HRTEM, HR-STEM)• Energy Filtered TEM (EFTEM)• Electron Energy Loss Spectroscopy (EELS)• Energy Dispersive Spectroscopy (EDS)• Dual-Beam Focused Ion Beam (DB-FIB) • Scanning Electron Microscopy (SEM) Design of Experiments Team Mentoring

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