Mike Bruce

Electronic Device Failure Analysis (Edfa) Magazine Editor at Asm International

Based in Austin, United States

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Location

Austin

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Non-profit Organizations

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296

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m•••••••@asminternational.org

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Background

About Mike Bruce

PhD level Senior Semiconductor Professional recognized for expertise in developing new tools and techniques related to failure analysis, design debug, reliability and processing of semiconductor IC’s. A proven track record of innovation with over 74 patents and 30 publications including two major paper awards presented at international conferences. Extensive experience working in international collaborations (research, development, implementation and benchmarking) which includes Sandia National Labs, University of Texas at Austin, Rice University, University of Nebraska, National University of Singapore (NUS), Semicaps Ltd.(Singapore), Motorola/Freescale, IBM, Schlumberger, Optonics, Sensors Unlimited/Goodrich and ISMI Sematech (Reliability, Metrology, and Failure Analysis Councils). As well, committe work and/or tutorials at ISTFA, EDFAS, IRPS, IPFA, LEOS, EDFA magazine, University of New Mexico, University of Texas at Austin, Michigan Tech, Louisiana Tech, and Rice University. Specialties: Backside Failure Analysis; Optical based Semicondutor IC probing: eg. LVP, LTP, SDL, LADA, TIVA/OBIRCH, LIVA/OBIC, Emission microscopy, Time Resolved Emission, Raman & Infrared thermography, NSOM; Semiconductor Device Failure Analysis and Reliability; Analytical Tool & Technique Development for IC's; AFM & Nanotechnology

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