Naveen Nayaka

Background

About Naveen Nayaka

Technical Summary:Failure Analysis: • Analysis of failures in 3D NAND X3 node for die and block fails and classification of failures into different groups. • Debug of selective data and non-data word line fails and VCC variation issues. Test Program Development and Validation: • Interacting with different business units to understand the product requirement and prepare the test plan. • Converting the test plan into executable C sequence. Validation of the sequence for functional correctness before starting the actual evaluation. Parser Development and Automated reporting: • Writing Python scripts to transform raw test data into organized tabular format which can be loaded into an analysis tool for further investigation.• Automated plot and report generation to simplify the analysis of large volume test data. Product support (Device analysis for system firmware feedback): • Mimicking system write abort scenarios and providing device characterization feedback for firmware development-SLC and TLC. • Creating different conditions of partially written blocks and optimizing the read level voltage for the last written word line.3D NAND reliability and performance characterization for trim and process judge: • Interaction with cross geographical teams to get test requirements. • Characterization for initial technology ramp-up and product planning: TLC/pQLC.