Peter Basa

Background

About Peter Basa

With over 20 years of experience in optical metrology, I am the Deputy Manager of the Optical Division at Semilab, a global leader in providing characterization and inspection solutions for the solar and semiconductor industry. I hold a Ph.D. in Physics from the Technical University of Budapest, where I specialized in spectroscopic ellipsometry and reflectometry of thin films and nanostructures. As the Deputy Manager, I oversee the development, production, and marketing of our ellipsometer products, which are used for measuring the thickness, composition, and optical properties of thin films and materials. I also collaborate with our R&D and sales teams to identify customer needs, define product specifications, and deliver innovative and reliable solutions. I have contributed to multiple publications in prestigious journals, demonstrating our cutting-edge research and expertise in optical metrology. My mission is to enable our customers to achieve optimal performance and quality in their products and processes, by providing them with the best optical metrology tools and services.