Peter H. Thiesen

Application Specialist Imaging Spectroscopic Ellipsometry at Park Systems

Based in Göttingen, Germany

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Seniority

Staff

Department

Science

Location

Göttingen

Industry

Nanotechnology Research

Company size

200

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Email

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p•••••••@parksystems.com

Phone

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+49 ••• •••• ••••

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Background

About Peter H. Thiesen

Spectroscopic Imaging Ellipsometer enable ellipsometry with the lateral resolution of an optical microscope and with the unique sensitivity of ellipometry for ultrathin films and changes in the optical properties. Typical applications- Graphene & other 2D materials - Organic electronics - Organic solar cells - OLED - MEMS - Polymer brushes - Thin polymer films - Self-assembled monolayers (SAM)- Lipid bilayers - Liquid / liquid interface - Others Very close related is Brewster Angle microscopy – a technique that enable especially the visualization of nanofilms at the air/water interface. Applications of Brewster Angle Microscopy- Lipid monolayers - Langmuir-Blodgett films - Floating monolayers - Air / water interface

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