Sadek Laskar

Background

About Sadek Laskar

As an experienced Product Test Development engineer, I specialize in developing and implementing effective testing strategies for digital and mixed signal blocks of cutting edge high power Automotive DSPs. Working closely with the design team, I focus on design for testability (DFT) features such as MBIST, Memory repair, AVS Char, Complete Power Profiling and Characterization, ADC and DAC Characterization, High Speed DDR AC characterization, Ethernet AC Characterization, Timer AC Characterization, and more. With extensive experience in ATE Advantest 93K tester and a deep understanding of hardware and software testing, developing efficient testmethods for comprehensive testing, I'm dedicated to deliver exceptional user experiences through complex test plans that exceed our customer expectations. I excel right from Simulations of Complex testcases to converting them for silicon debug using ATE to unravel functional bugs, and characterizing silicon across different process, temperature, and voltage corners to ensure data sheet limits are met. Collaborating closely with cross-functional teams, and identify issues early and optimize product performance for maximum efficiency. With a passion for problem-solving and a deep understanding of the latest technologies and methodologies, I'm always looking for new ways to improve processes and drive results.