Sangjin Lee

Background

About Sangjin Lee

A.** I have served in the semiconductor metrology, inspection, and wafer test capital equipment for thirty-five years, specializing in optical instruments. My expertise includes: 1) Spectroscopic reflectometry, scatterometry, and spectroscopic ellipsometry technology. 2) Dark field and bright field inspection as well as 2D/3D inspection. 3) Laser grooving, scribing, and ultra-short pulse full cut dicing. Additionally, I am an expert in semiconductor UI/UX consulting.**B.** I have diverse experience in technical support management, application development, strategic marketing, and pipeline sales management,**C.** I have held executive positions, including EVP, VP, and General Manager, in semiconductor equipment companies across the USA, Germany, China, and Korea.**D.** I possess expertise in integrated metrology at the CMP process for major companies such as Intel, Samsung, and SK Hynix.**E.** I provide strategic investment consulting in the OLED, solar, and semiconductor industries.