Sheldon Tan

Background

About Sheldon Tan

Dr. Sheldon X-D. Tan is a Professor in the Department of Electrical Engineering, University of California, Riverside, CA. He a cooperative faculty member in the Department of Computer Science and Engineering at UCR. Dr. Sheldon Tan received his B.S. and M.S. degrees in electrical engineering from Fudan University, Shanghai, China in 1992 and 1995, respectively, and the Ph.D. degree in electrical and computer engineering from the University of Iowa, Iowa City, in He was a visiting professor of Kyoto University as a JSPS Fellow in 2017. He is Fellow of and CEDA Distinguished Lecturer. His research interests include machine and deep learning for VLSI reliability modeling and optimization at circuit and system levels, machine learning for circuit and thermal simulation, thermal modeling, optimization, and dynamic thermal management for many-core processors. He has published more than 350 technical papers and has co-authored 6 books on those areas. Dr. Tan received NSF CAREER Award in 2004. He also received Best Paper Awards from ICSICT'18, ASICON’17, ICCD'07, DAC’09. He also received ASPDAC Prolific Author Award in 2020. He also received the Honorable Mention Best Paper Award from SMACD’18. He was a Visiting Professor of Kyoto University as a JSPS Fellow from Dec. 2017 to Jan. He will also serve CEDA Distinguished Lecturer for 2022-2023. He has served as TPC Chair for ASPDAC 2021, and the TPC Vice Chair for ASPDAC 2020. He served as Editor in Chief for Elsevier’s Integration, the VLSI Journal from 2016-2025, the Associate Editor for three journals: Transaction on VLSI Systems (TVLSI), ACM Transaction on Design Automation of Electronic Systems (TODAES), and Elsevier’s Microelectronics Reliability.