Steve Schauer
Senior Director at Beamline
Based in Chandler, United States
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Seniority
Director
Department
Manufacturing & Production
Location
Chandler
Industry
Semiconductor Manufacturing
Company size
12
Contact information
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s•••••••@beamline.com
Phone
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Background
About Steve Schauer
Expert in Secondary Ion Mass Spectrometry (SIMS) and Total Reflection X-Ray Fluorescence (TXRF). Extensive experience with Cameca IMS 3f, 4f, 5f and 6f magnetic sector; Atomika 4500 quadrupole SIMS; Technos and Rigaku TXRF instruments. Familiar with Cameca IMS 7f Auto, Atomika 4550; Phi quadrupole and IONTOF TOF-SIMS instruments. Familiar with most techniques relevant to semiconductor analysis and metrology, including SEM, TEM, FIB, VPD-ICP/MS; AFM; Auger; TOF-SIMS; etc.
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