Tibor Grasser

Background

About Tibor Grasser

Tibor Grasser is a professor of microelectronics reliability at the Institute for Microelectronics, Technische Universität Wien. He has been the Head of the Institute for Microelectronics since 2016. Since 1997 he has headed the Minimos-NT development group, working on the successor of the highly successful MiniMOS program. From 2003 till 2010 he was the director of the Christian Doppler Laboratory for TCAD in Microelectronics. Dr. Grasser is the co-author or author of over 450 articles in scientific books, journals, and conferences proceedings, and has presented invited talks, tutorials and short courses at various conferences such as the IEDM, IRPS, VLSI Symp, SISPAD, ESSDERC, IIRW, ESREF, INFOS, ISDRS, and the ECS meetings. He is an Fellow, the editor of a book on advanced device simulation, organic electronics, the bias temperature instability, and hot carrier degradation, a distinguished lecturer of the Electron Devices Society, has been involved in the program and management committees of conferences such as IEDM, IRPS, SISPAD, IWCE, ESSDERC, IIRW, and ISDRS, and is a recipient of the Best Paper Awards at IRPS (2008, 2010, and 2012), ESREF 2008, and IPFA (2013 and 2014) as well as the EDS Paul Rappaport Award 2011. He was also a Chairman of SISPAD 2007 and General Chair of IIRW 2014. His current scientific interests include semiconductor device reliability issues as well as device modeling and simulation in general.