Roberto Izzi
Member of Technical Staff System Architect at Micron Technology
Based in Caserta, Italy
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Seniority
Other
Department
Other
Location
Caserta
Industry
Semiconductor Manufacturing
Company size
36K
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r•••••••@micron.com
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Background
About Roberto Izzi
Publications: A. Girardi, A. Conci, R. Izzi, T. Lessio, F.G Canavero, I.S. Stievano, H. Dudek, D. Hardisty, M. Tarantini, M. Dieudonne, J. Van Hese, T.R. Cunha, J.C. Pedro, C. Gaquiere, N. Vellas,"MOCHA – Signal and Power Integrity Analysis" A. Girardi, I.S. Stievano, R. Izzi, T. Lessio, F.G. Canavero, I. Maio, L. Rigazio,"Enhanced Mpilog Model for Power Integrity Analysis" I.S. Stievano, I.A. Maio, L. Rigazio, F.G. Canavero, R. Izzi, A. Girardi, T. Lessio, A. Conci, T. Cunha, H. Teixeira, J.C. Pedro,"Characterization and modeling of the power delivery networks of memory chips" I. S. Stievano, L. Rigazio, I. A. Maio, A. Girardi, R. Izzi, F. Vitale, T. Lessio,"Modeling of IC power supply and I/O ports from measurements" T.R. Cunha, H.M. Teixeira, J.C. Pedro, I.S. Stievano, L. Rigazio, F.G. Canavero, R. Izzi, F. Vitale, A.Girardi,"Validation by Measurements of a IC Modeling Approach for SiP Applications" I.S. Stievano, L.Rigazio, F.G. Canavero, T.R. Cunha, J.C. Pedro, H.M. Teixeira, A.Girardi, R. Izzi, F.Vitale,"Behavioral modeling of IC memories from measured data" M.Costagliola, A.Girardi, D.Decaro, R.Izzi, N.Rinaldi, M.Spirito, P.Spirito "An experimental power-lines model for digital ASICs based on transmission-lines" Pulici, P. Girardi, A. Vanalli, G.P. Izzi, R. Bernardi, G. Ripamonti, G. Strollo, A.G.M. Campardo, G. “A modified IBIS model aimed at signal integrity analysis of Systems in Package” Capriglione, D. Chiariello, A.G. Maffucci, A. Bencivinni, M. Camarda, F. Girardi, A. Fusillo, G. Izzi, R. Martines, I.“Modeling and characterization of parasitic radiated emission from a Flash memory” Chiariello, A.G. Girardi, A. Iorio, C. Izzi, R. Lessio, T. Maffucci, A. Ventre, S. “Efficient evaluation of the frequency-dependent impedance matrix of full-package structures” Capriglione, D. Chiariello, A.G. Fusillo, G. Girardi, A. Izzi, R. Maffucci, A. Martines, I. “Characterization and modeling of the electromagnetic behavior of ICs and packages”
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